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» Research on optimizing the fault diagnosis strategy of compl...
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COMSIS
2010
14 years 7 months ago
Research on optimizing the fault diagnosis strategy of complex electronic equipment
Hong-Xia Wang, Xiao-Hui Ye, Liang Wang
91
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EH
2005
IEEE
127views Hardware» more  EH 2005»
15 years 3 months ago
On the Robustness Achievable with Stochastic Development Processes
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
Shivakumar Viswanathan, Jordan B. Pollack
ICCAD
2000
IEEE
95views Hardware» more  ICCAD 2000»
15 years 2 months ago
Test of Future System-on-Chips
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
Yervant Zorian, Sujit Dey, Mike Rodgers