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» Rethinking central pattern generators: A general approach
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ITC
2003
IEEE
327views Hardware» more  ITC 2003»
15 years 2 months ago
Case Study - Using STIL as Test Pattern Language
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
Daniel Fan, Steve Roehling, Rusty Carruth
ACSAC
2004
IEEE
15 years 1 months ago
RACOON: Rapidly Generating User Command Data For Anomaly Detection From Customizable Templates
One of the biggest obstacles faced by user command based anomaly detection techniques is the paucity of data. Gathering command data is a slow process often spanning months or yea...
Ramkumar Chinchani, Aarthie Muthukrishnan, Madhusu...
ICSM
2002
IEEE
15 years 2 months ago
Documenting Pattern Use in Java Programs
Design patterns are widely recognized as important software development methods. Their use as software understanding tools, though generally acknowledged has been scarcely explore...
Marco Torchiano
94
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GECCO
2007
Springer
182views Optimization» more  GECCO 2007»
15 years 3 months ago
Generating large-scale neural networks through discovering geometric regularities
Connectivity patterns in biological brains exhibit many repeating motifs. This repetition mirrors inherent geometric regularities in the physical world. For example, stimuli that ...
Jason Gauci, Kenneth O. Stanley
ICPR
2004
IEEE
15 years 10 months ago
Two-Stage Classification System combining Model-Based and Discriminative Approaches
For the tasks of classification, two types of patterns can generate problems: ambiguous patterns and outliers. Furthermore, it is possible to separate classification algorithms in...
Jonathan Milgram, Mohamed Cheriet, Robert Sabourin