768 search results - page 66 / 154 » Robustness of Sequential Circuits |
101
Voted
ICRA
2010
IEEE
14 years 10 months ago
2010
IEEE
As robots and humans move towards sharing the same environment, the need for safety in robotic systems is of growing importance. Towards this goal of human-friendly robotics, a rob...
115
Voted
ISQED
2008
IEEE
15 years 7 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
121
Voted
DAC
2006
ACM
15 years 6 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
75
Voted
DAC
2009
ACM
16 years 1 months ago
2009
ACM
In this paper we introduce a new method of performing direct solution of the harmonic balance Jacobian. For examples with moderate number of harmonics and moderate to strong nonli...
119
Voted
ICCAD
2006
IEEE
15 years 9 months ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...