45 search results - page 1 / 9 » Rough Histograms for Robust Statistics |
ICPR
2000
IEEE
13 years 9 months ago
2000
IEEE
Applied statistics are widely used in pattern recognition and other computing applications tofind the most likely value of a parameter. The use of classical empirical statistics i...
3DPVT
2004
IEEE
13 years 9 months ago
2004
IEEE
Similarity measuring is a key problem for 3D model retrieval. In this paper, we propose a novel shape descriptor "Thickness Histogram" (TH) by uniformly estimating thick...
DAC
2008
ACM
14 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
MICCAI
1998
Springer
13 years 10 months ago
1998
Springer
Abstract. In this paper, we propose a robust fully non-supervised method dedicated to the segmentation of the brain in T1-weighted MR images. The first step consists in the analysi...
ICIAR
2005
Springer
13 years 11 months ago
2005
Springer
A method for color indexing is proposed that is based upon nonparametric statistical techniques. Nonparametrics compare the ordinal rankings of sample populations, and maintain the...