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VLSID
2007
IEEE
152views VLSI» more  VLSID 2007»
14 years 6 months ago
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip K...
DAC
2004
ACM
14 years 7 months ago
Selective gate-length biasing for cost-effective runtime leakage control
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Denn...
VLSID
2010
IEEE
170views VLSI» more  VLSID 2010»
13 years 1 days ago
Novel Vth Hopping Techniques for Aggressive Runtime Leakage Contro
The continuous increase of leakage power consumption in deep sub-micro technologies necessitates more aggressive leakage control. Runtime leakage control (RTLC) is effective, si...
Hao Xu, Wen-Ben Jone, Ranga Vemuri
DAC
2003
ACM
14 years 7 months ago
Implications of technology scaling on leakage reduction techniques
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
Yuh-Fang Tsai, David Duarte, Narayanan Vijaykrishn...
DAC
2004
ACM
14 years 7 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw