103 search results - page 10 / 21 » SEU tolerant device, circuit and processor design |
PATMOS
2007
Springer
15 years 3 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
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GLVLSI
2008
IEEE
15 years 4 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
ISVLSI
2007
IEEE
15 years 4 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
MICRO
2010
IEEE
14 years 7 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...