103 search results - page 11 / 21 » SEU tolerant device, circuit and processor design |
DSN
2011
IEEE
13 years 9 months ago
2011
IEEE
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
CF
2004
ACM
15 years 3 months ago
2004
ACM
Nanoelectronics research has primarily focused on devices. By contrast, not much has been published on innovations at higher layers: we know little about how to construct circuits...
ETS
2010
IEEE
14 years 10 months ago
2010
IEEE
This paper explores the concept of design diversity redundancy applied to mixed-signal (MS) circuit blocks, as a proposal to increase system reliability. Three different implement...
CHES
2005
Springer
15 years 3 months ago
2005
Springer
Electromagnetic analysis (EMA) can be used to compromise secret information by analysing the electric and/or magnetic fields emanating from a device. It follows differential power...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...