103 search results - page 21 / 21 » SEU tolerant device, circuit and processor design |
ASPLOS
2006
ACM
14 years 7 days ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
MICRO
2008
IEEE
14 years 20 days ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
RTSS
2006
IEEE
14 years 8 days ago
2006
IEEE
Modern FPGA devices, which include (multiple) processor core(s) as diffused IP on the silicon die, provide an excellent platform for developing custom multiprocessor systems-on-pr...