103 search results - page 3 / 21 » SEU tolerant device, circuit and processor design |
FPL
2006
Springer
13 years 10 months ago
2006
Springer
Reconfigurable architectures are becoming increasingly popular with space related design engineers as they are inherently flexible to meet multiple requirements and offer signific...
DAC
2008
ACM
14 years 7 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
ISLPED
2000
ACM
13 years 10 months ago
2000
ACM
Processors in portable electronic devices generally have a computational load which has time-varying performance requirements. Dynamic Voltage Scaling is a method to vary the proc...
DATE
2005
IEEE
13 years 12 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
AHS
2006
IEEE
14 years 10 days ago
2006
IEEE
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...