29 search results - page 3 / 6 » SPIN-TEST: automatic test pattern generation for speed-indep... |
DAC
1999
ACM
13 years 10 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
ATS
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
DDECS
2007
IEEE
14 years 18 days ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
EVOW
2001
Springer
13 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
ISCAS
2007
IEEE
14 years 17 days ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...