23 search results - page 5 / 5 » SRAM parametric failure analysis |
BMCBI
2008
14 years 9 months ago
2008
Background: We propose a statistically principled baseline correction method, derived from a parametric smoothing model. It uses a score function to describe the key features of b...
PICS
2000
14 years 11 months ago
2000
Eastman Kodak Company is using a scanner-based image quality measurement system to perform production line testing of the image quality of a high-quality thermal media based imagi...
ECCV
2004
Springer
15 years 11 months ago
2004
Springer
This paper proposes a robust estimation and validation framework for characterizing local structures in a positive multi-variate continuous function approximated by a Gaussian-base...