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121
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
151
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KBSE
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper we discuss a model-based approach to verifying web service compositions for web service implementations. This approach provides verification of properties created fr...
144
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KBSE
2003
IEEE
15 years 10 months ago
2003
IEEE
Eliciting the requirements for a proposed system typically involves different stakeholders with different expertise, responsibilities, and perspectives. Viewpoints-based approache...
141
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KBSE
2003
IEEE
15 years 10 months ago
2003
IEEE
We discuss how a collection of domain-specific and domain-independent tools can be combined to “aspectize” the distributed character of server-side applications, to a much gr...
148
Voted
WCRE
2003
IEEE
15 years 10 months ago
2003
IEEE
Merging and splitting source code artifacts is a common activity during the lifespan of a software system; as developers rethink the essential structure of a system or plan for a ...