5246 search results - page 164 / 1050 » Sanitization models and their limitations |
EVOW
2008
Springer
15 years 1 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
115
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ESANN
2006
15 years 1 months ago
2006
Blind source separation (BSS) has become one of the major signal and image processing area in many applications. Principal component analysis (PCA) and Independent component analys...
100
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WSC
2004
15 years 1 months ago
2004
In this paper we describe a methodology that includes the complementary use of simulated annealing and response surface methodology (RSM). The methodology was developed for analys...
104
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ENTCS
2006
14 years 11 months ago
2006
Runtime verification involves monitoring the system at runtime to check for conformance of the execution trace to user defined safety properties. Typically, run-time verifiers do ...
ENTCS
2008
14 years 10 months ago
2008
Previous research has developed a formal methods-based (cognitive-level) model of the Interacting Cognitive Subsystems central engine, with which we have simulated attentional cap...