Learning Bayesian networks from data has been studied extensively in the evolutionary algorithm communities [Larranaga96, Wong99]. We have previously explored extending some of the...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
—As the cost per bit of NAND flash memory devices rapidly decreases, NAND-flash-based Solid-State Disks (SSDs) are replacing Hard Disk Drives (HDDs) used in a wide spectrum of co...
Dong Kim, Kwanhu Bang, Seung-Hwan Ha, Sungroh Yoon...
NASA’s satellites currently do not make use of advanced image compression techniques during data transmission to earth because of limitations in the available platforms. With th...
Commercial soft processors are unable to effectively exploit the data parallelism present in many embedded systems workloads, requiring FPGA designers to exploit it (laboriously) ...
Peter Yiannacouras, J. Gregory Steffan, Jonathan R...