22 search results - page 5 / 5 » Scalable Test Generators for High-Speed Datapath Circuits |
181
Voted
HIPEAC
2011
Springer
14 years 3 months ago
2011
Springer
In chip multiprocessors (CMPs), data accesslatency dependson the memory hierarchy organization, the on-chip interconnect (NoC), and the running workload. Reducing data access late...
98
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...