1661 search results - page 284 / 333 » Scales and Scale-like Structures |
105
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MICRO
2009
IEEE
15 years 6 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
SIGCOMM
2009
ACM
15 years 6 months ago
2009
ACM
IPTV is increasingly being deployed and offered as a commercial service to residential broadband customers. Compared with traditional ISP networks, an IPTV distribution network (i...
114
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MICRO
2008
IEEE
15 years 5 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ICCV
2007
IEEE
15 years 5 months ago
2007
IEEE
We propose an operational method to extract the left ventricle (LV) systole dynamics using HARmonic Phase (HARP) images extracted from tagged cardiac MR sequences. Established tec...
100
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MICRO
2007
IEEE
15 years 5 months ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...