234 search results - page 39 / 47 » Scaling, Power and the Future of CMOS |
IEICET
2010
14 years 8 months ago
2010
This paper predicts self-heating effect in a short intrablock wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate an...
MICRO
2008
IEEE
15 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ISCA
2003
IEEE
15 years 2 months ago
2003
IEEE
Scaling of CMOS technology causes the power supply voltages to fall and supply currents to rise at the same time as operating speeds are increasing. Falling supply voltages cause ...
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WWW
2007
ACM
15 years 10 months ago
2007
ACM
The aggregation and comparison of behavioral patterns on the WWW represent a tremendous opportunity for understanding past behaviors and predicting future behaviors. In this paper...
DEBS
2010
ACM
15 years 1 months ago
2010
ACM
A new publish/subscribe capability is presented: the ability to predict the likelihood that a subscription will be matched at some point in the future. Composite subscriptions con...