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ITC
2000
IEEE
68views Hardware» more  ITC 2000»
15 years 4 months ago
Current ratios: a self-scaling technique for production IDDQ testing
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, ...
70
Voted
TOG
2002
133views more  TOG 2002»
14 years 11 months ago
Structural modeling of flames for a production environment
In this paper we describe a system for animating flames. Stochastic models of flickering and buoyant diffusion provide realistic local appearance while physics-based wind fields a...
Arnauld Lamorlette, Nick Foster
CNHPCA
2009
Springer
15 years 6 months ago
Benchmarking Parallel I/O Performance for a Large Scale Scientific Application on the TeraGrid
This paper is a report on experiences in benchmarking I/O performance on leading computational facilities on the NSF TeraGrid network with a large scale scientific application. In...
Frank Löffler, Jian Tao, Gabrielle Allen, Eri...
ITC
1996
IEEE
123views Hardware» more  ITC 1996»
15 years 3 months ago
IDDQ Test: Sensitivity Analysis of Scaling
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put more functionality on the same piece of silicon. ...
Thomas W. Williams, Robert H. Dennard, Rohit Kapur...
ADMA
2006
Springer
150views Data Mining» more  ADMA 2006»
15 years 5 months ago
Web Scale Competitor Discovery Using Mutual Information
Abstract. The web with its rapid expansion has become an excellent resource for gathering information and people’s opinion. A company owner wants to know who is the competitor, a...
Rui Li, Shenghua Bao, Jin Wang, Yuanjie Liu, Yong ...