61 search results - page 10 / 13 » Scan chain clustering for test power reduction |
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
DFT
2004
IEEE
15 years 1 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...