12 search results - page 3 / 3 » Scan-Based BIST Diagnosis Using an Embedded Processor |
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
HIS
2009
13 years 4 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...