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89
Voted
VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 1 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
72
Voted
SIGIR
2004
ACM
15 years 3 months ago
Forming test collections with no system pooling
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...
Mark Sanderson, Hideo Joho
86
Voted
USS
2008
14 years 12 months ago
Pre-Election Testing and Post-Election Audit of Optical Scan Voting Terminal Memory Cards
Optical scan electronic voting machines employ software components that are customized for each specific election. Such software components are critical from a security and integr...
Seda Davtyan, Sotiris Kentros, Aggelos Kiayias, La...
KBSE
2007
IEEE
15 years 3 months ago
Directed test generation using symbolic grammars
We present CESE, a tool that combines exhaustive enumeration of test inputs from a structured domain with symbolic execution driven test generation. We target programs whose valid...
Rupak Majumdar, Ru-Gang Xu
IUI
2005
ACM
15 years 3 months ago
Context-based similar words detection and its application in specialized search engines
This paper presents a new context-based method for automatic detection and extraction of similar and related words from texts. Finding similar words is a very important task for m...
Hisham Al-Mubaid, Ping Chen