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SCAM
2009
IEEE
15 years 9 months ago
An Assessment of Type-3 Clones as Detected by State-of-the-Art Tools
Rebecca Tiarks, Rainer Koschke, Raimar Falke
SCAM
2009
IEEE
15 years 9 months ago
Static Estimation of Test Coverage
Tiago L. Alves, Joost Visser