While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
In this paper, we propose a technique for leveraging historical field failure records in conjunction with automated static analysis alerts to determine which alerts or sets of ale...
Mark Sherriff, Sarah Smith Heckman, J. Michael Lak...
In this paper we provide a fast, data-driven solution to the failing query problem: given a query that returns an empty answer, how can one relax the query's constraints so t...
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, J...
We present a model, based on the maximum entropy method, for analyzing various measures of retrieval performance such as average precision, R-precision, and precision-at-cutoffs....