376 search results - page 74 / 76 » Self-Assembled Circuit Patterns |
MTDT
2003
IEEE
13 years 11 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
KDD
2002
ACM
14 years 6 months ago
2002
ACM
Graphs are an increasingly important data source, with such important graphs as the Internet and the Web. Other familiar graphs include CAD circuits, phone records, gene sequences...
ISCAS
2006
IEEE
14 years 8 days ago
2006
IEEE
Abstract- We present an architecture and VLSI implemen- Various strategies in the analysis of spatio-temporal dynamtation of a distributed neural interface and spatio-temporal ics ...
UIST
2004
ACM
13 years 11 months ago
2004
ACM
We present SketchREAD, a multi-domain sketch recognition engine capable of recognizing freely hand-drawn diagrammatic sketches. Current computer sketch recognition systems are dif...
SIGCOMM
2003
ACM
13 years 11 months ago
2003
ACM
Routers built around a single-stage crossbar and a centralized scheduler do not scale, and (in practice) do not provide the throughput guarantees that network operators need to ma...