Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J...
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
—There exists numerous Grid middleware to develop and execute programs on the computational Grid, but they still require intensive work from their users. BitDew is made to facili...
The neighborhood information has been frequently used by protocols such as routing in sensor networks. Many methods have been proposed to protect such information in hostile envir...
—Hyperbolic position bounding (HPB) provides a mechanism to probabilistically delimit the location of a wireless network malicious insider to a candidate area. A large scale path...