1287 search results - page 155 / 258 » Self-Normalized Linear Tests |
114
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VEE
2012
ACM
13 years 7 months ago
2012
ACM
As cloud-based computation becomes increasingly important, providing a general computational interface to support datacenterscale programming has become an imperative research age...
130
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CVPR
2012
IEEE
13 years 2 months ago
2012
IEEE
Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one of two extreme options: mat...
104
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LATA
2009
Springer
15 years 6 months ago
2009
Springer
We introduce the class of Rigid Tree Automata (RTA), an extension of standard bottom-up automata on ranked trees with distinguished states called rigid. Rigid states define a rest...
82
Voted
IH
2009
Springer
15 years 6 months ago
2009
Springer
Media forensics tries to determine the originating device of a signal. We apply this paradigm to microphone forensics, determining the microphone model used to record a given audio...
125
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VTS
2000
IEEE
15 years 4 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...