1287 search results - page 27 / 258 » Self-Normalized Linear Tests |
113
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ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
DFT
2005
IEEE
15 years 8 months ago
2005
IEEE
In this paper, we propose a system-level error tolerance scheme for systems where a linear transform is combined with quantization. These are key components in multimedia compress...
111
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ICCD
2002
IEEE
15 years 8 months ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
152
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STOC
2004
ACM
16 years 3 months ago
2004
ACM
Abstract. In the late nineties, Erickson proved a remarkable lower bound on the decision tree complexity of one of the central problems of computational geometry: given n numbers, ...
116
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ICCAD
2006
IEEE
16 years 1 days ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...