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VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
16 years 1 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
AAAI
1990
15 years 2 months ago
The Design of a Marker Passing Architecture for Knowledge Processing
Knowledge processing is very demanding on computer architectures. Knowledge processing generates subcomputation paths at an exponential rate. It is memory intensive and has high c...
Wing Lee, Dan I. Moldovan
ASAP
2003
IEEE
124views Hardware» more  ASAP 2003»
15 years 6 months ago
Arbitrary Bit Permutations in One or Two Cycles
Symmetric-key block ciphers encrypt data, providing data confidentiality over the public Internet. For inter-operability reasons, it is desirable to support a variety of symmetric...
Zhijie Shi, Xiao Yang, Ruby B. Lee
ASPLOS
2010
ACM
15 years 8 months ago
Dynamic filtering: multi-purpose architecture support for language runtime systems
This paper introduces a new abstraction to accelerate the readbarriers and write-barriers used by language runtime systems. We exploit the fact that, dynamically, many barrier exe...
Tim Harris, Sasa Tomic, Adrián Cristal, Osm...
DAC
2004
ACM
16 years 2 months ago
Multi-profile based code compression
Code compression has been shown to be an effective technique to reduce code size in memory constrained embedded systems. It has also been used as a way to increase cache hit ratio...
Eduardo Wanderley Netto, Rodolfo Azevedo, Paulo Ce...