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ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
15 years 1 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
145
Voted
EUC
2005
Springer
15 years 9 months ago
Collision Attack on XTR and a Countermeasure with a Fixed Pattern
Public-key cryptosystem (PKC) is one of inevitable key technologies in order to accomplish fruitful security applications in ubiquitous computing systems. The ubiquitous computer o...
Dong-Guk Han, Tsuyoshi Takagi, Tae-Hyun Kim, Howon...
CBMS
2003
IEEE
15 years 9 months ago
An Imaging System Correlating Lip Shapes with Tongue Contact Patterns for Speech Pathology Research
In this research, an imaging system was built to work with a newly developed electronic device to help people produce sounds correctly. The system consists of two parts, the inter...
D. J. Lee, Daniel Bates, Christopher Dromey, Xiaoq...
FM
1999
Springer
107views Formal Methods» more  FM 1999»
15 years 8 months ago
A Formalization of Software Architecture
Software architecture addresses the high level specification, design and analysis of software systems. Formal models can provide essential underpinning for architectural descripti...
John Herbert, Bruno Dutertre, Robert A. Riemenschn...
ISSTA
2009
ACM
15 years 10 months ago
Exception analysis and points-to analysis: better together
Exception analysis and points-to analysis are typically done in complete separation. Past algorithms for precise exception analysis (e.g., pairing throw clauses with catch stateme...
Martin Bravenboer, Yannis Smaragdakis