In efforts to overcome the complexity of the syntax and the lack of formal semantics of conventional hardware description languages, a number of functional hardware description la...
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
This paper develops new relationships between resource-bounded dimension, entropy rates, and compression. New tools for calculating dimensions are given and used to improve previo...
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
The desire for definitive data and the semantic web drive for inference over heterogeneous data sources requires co-reference resolution to be performed on those data. In particul...