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ICCAD
2000
IEEE
97views Hardware» more  ICCAD 2000»
15 years 6 months ago
Error Catch and Analysis for Semiconductor Memories Using March Tests
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
ISCA
2006
IEEE
92views Hardware» more  ISCA 2006»
15 years 1 months ago
Quantum Memory Hierarchies: Efficient Designs to Match Available Parallelism in Quantum Computing
The assumption of maximum parallelism support for the successful realization of scalable quantum computers has led to homogeneous, "sea-of-qubits" architectures. The res...
Darshan D. Thaker, Tzvetan S. Metodi, Andrew W. Cr...
CASES
2010
ACM
14 years 12 months ago
Fine-grain dynamic instruction placement for L0 scratch-pad memory
We present a fine-grain dynamic instruction placement algorithm for small L0 scratch-pad memories (spms), whose unit of transfer can be an individual instruction. Our algorithm ca...
JongSoo Park, James D. Balfour, William J. Dally
CLOUDCOM
2010
Springer
14 years 12 months ago
REMEM: REmote MEMory as Checkpointing Storage
Checkpointing is a widely used mechanism for supporting fault tolerance, but notorious in its high-cost disk access. The idea of memory-based checkpointing has been extensively stu...
Hui Jin, Xian-He Sun, Yong Chen, Tao Ke
LCTRTS
2010
Springer
14 years 12 months ago
RNFTL: a reuse-aware NAND flash translation layer for flash memory
In this paper, we propose a hybrid-level flash translation layer (FTL) called RNFTL (Reuse-Aware NFTL) to improve the endurance and space utilization of NAND flash memory. Our bas...
Yi Wang, Duo Liu, Meng Wang, Zhiwei Qin, Zili Shao...