410 search results - page 63 / 82 » Side Effects of Digital Technology |
92
Voted
DATE
2009
IEEE
15 years 7 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
IV
2008
IEEE
15 years 7 months ago
2008
IEEE
Hierarchically structured data collections often need to be visualized for the purposes of digital information management and presentation. File browsing, in particular, has an in...
106
Voted
COMPSAC
2006
IEEE
15 years 6 months ago
2006
IEEE
The convergence of data, voice and multimedia communication over digital networks, coupled with continuous improvement in network capacity and reliability has significantly enrich...
135
click to vote
ISQED
2006
IEEE
15 years 6 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
104
Voted
ASPDAC
2006
ACM
15 years 6 months ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...