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DATE
2000
IEEE
134views Hardware» more  DATE 2000»
15 years 11 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee
ESANN
2004
15 years 8 months ago
Learning by geometrical shape changes of dendritic spines
The role of dendritic spines in neuronal information processing is still not completely clear. However, it is known that spines can change shape rapidly during development and duri...
Andreas Herzog, Vadym Spravedlyvyy, Karsten Kube, ...
TSP
2008
166views more  TSP 2008»
15 years 7 months ago
Audio Denoising by Time-Frequency Block Thresholding
Abstract--Removing noise from audio signals requires a nondiagonal processing of time-frequency coefficients to avoid producing "musical noise." State of the art algorith...
Guoshen Yu, Stéphane Mallat, Emmanuel Bacry
NN
2007
Springer
112views Neural Networks» more  NN 2007»
15 years 6 months ago
An augmented CRTRL for complex-valued recurrent neural networks
Real world processes with an “intensity” and “direction” component can be made complex by convenience of representation (vector fields, radar, sonar), and their processin...
Su Lee Goh, Danilo P. Mandic
ICANN
2007
Springer
16 years 1 months ago
A Two-Layer ICA-Like Model Estimated by Score Matching
Abstract. Capturing regularities in high-dimensional data is an important problem in machine learning and signal processing. Here we present a statistical model that learns a nonli...
Urs Köster, Aapo Hyvärinen