16 search results - page 3 / 4 » Silicon CMOS devices beyond scaling |
ICCD
2007
IEEE
14 years 3 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
ISQED
2010
IEEE
13 years 4 months ago
2010
IEEE
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
DSN
2005
IEEE
13 years 12 months ago
2005
IEEE
It is now widely accepted that the CMOS technology implementing irreversible logic will hit a scaling limit beyond 2016, and that the increased power dissipation is a major limiti...
ISQED
2005
IEEE
13 years 12 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
MICRO
2008
IEEE
14 years 19 days ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...