809 search results - page 105 / 162 » Similarity, topology, and uniformity |
76
Voted
APCCAS
2006
IEEE
15 years 6 months ago
2006
IEEE
— On-chip decoupling capacitors (Decaps) are widely used to mitigate on-chip power supply noise. At and below 100nm on-chip decaps face leakage and area overhead problems associa...
86
Voted
GMP
2006
IEEE
15 years 6 months ago
2006
IEEE
Abstract. Low-discrepancy point distributions exhibit excellent uniformity properties for sampling in applications such as rendering and measurement. We present an algorithm for ge...
113
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IROS
2006
IEEE
15 years 6 months ago
2006
IEEE
— We report our development of a vision-based motion planning system for an autonomous motorcycle designed for desert terrain, where uniform road surface and lane markings are no...
90
Voted
APSEC
2005
IEEE
15 years 6 months ago
2005
IEEE
We present a new set of metrics for analyzing the interaction between the modules of a large software system. We believe that these metrics will be important to any automatic or s...
131
Voted
CSMR
2005
IEEE
15 years 6 months ago
2005
IEEE
Wrapping databases allows them to be reused in formerly unplanned contexts, such as web-based applications or federated systems. Indeed, a wrapper can provide external clients of ...