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DAC
2004
ACM
16 years 7 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
DAC
2005
ACM
16 years 7 months ago
Device and architecture co-optimization for FPGA power reduction
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
Lerong Cheng, Phoebe Wong, Fei Li, Yan Lin, Lei He
187
Voted
DAC
2006
ACM
16 years 7 months ago
A novel variation-aware low-power keeper architecture for wide fan-in dynamic gates
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
Hamed F. Dadgour, Rajiv V. Joshi, Kaustav Banerjee
DAC
2006
ACM
16 years 7 months ago
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
Wei-Shen Wang, Vladik Kreinovich, Michael Orshansk...
IPMI
2007
Springer
16 years 7 months ago
Learning Best Features and Deformation Statistics for Hierarchical Registration of MR Brain Images
A fully learning-based framework has been presented for deformable registration of MR brain images. In this framework, the entire brain is first adaptively partitioned into a numbe...
Guorong Wu, Feihu Qi, Dinggang Shen
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