974 search results - page 111 / 195 » Simulation blocks for TOSSIM-T2 |
VTS
1997
IEEE
15 years 3 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
120
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DAC
1997
ACM
15 years 3 months ago
1997
ACM
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
AGENTS
1997
Springer
15 years 3 months ago
1997
Springer
Recent developments in philosophy, linguistics, developmental psychology and arti cial intelligence make it possible to envision a developmental path for an arti cial agent, groun...
ICCAD
1994
IEEE
15 years 3 months ago
1994
IEEE
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
103
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ICMCS
1994
IEEE
15 years 3 months ago
1994
IEEE
In this paper, we propose a novel observation-based admission control algorithm, in which a client is admitted for service by a multimedia server only if the predicted extrapolati...