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132
Voted
ESWA
2006
15 years 3 months ago
2006
As knowledge emerges as the primary strategic resource in the 21st century, many firms in the manufacturing and service sectors alike are beginning to introduce and implement Know...
113
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DFT
2007
IEEE
15 years 10 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
134
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DELTA
2002
IEEE
15 years 8 months ago
2002
IEEE
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
128
Voted
DAC
1999
ACM
15 years 7 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
132
Voted
DFT
2004
IEEE
15 years 7 months ago
2004
IEEE
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...