Sciweavers

12032 search results - page 2073 / 2407
» Simulation of Manufacturing Systems
Sort
View
163
Voted
CW
2003
IEEE
15 years 11 months ago
Virtual Experiment Environments Design for Science Education
Virtual reality technology is reported that the use of virtual reality(VR) as an educational tool can increase student interests, understanding and creative learning because of en...
Young-suk Shin
DATE
2003
IEEE
131views Hardware» more  DATE 2003»
15 years 11 months ago
High Speed and Highly Testable Parallel Two-Rail Code Checker
In this article we propose a high speed and highly testable parallel two-rail code checker, which features a compact structure and is Totally-Self-Checking or Strongly Code-Disjoi...
Martin Omaña, Daniele Rossi, Cecilia Metra
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
15 years 11 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
DFT
2003
IEEE
142views VLSI» more  DFT 2003»
15 years 11 months ago
Exploiting Instruction Redundancy for Transient Fault Tolerance
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller...
Toshinori Sato
DSD
2003
IEEE
121views Hardware» more  DSD 2003»
15 years 11 months ago
CCC: Crossbar Connected Caches for Reducing Energy Consumption of On-Chip Multiprocessors
With shrinking feature size of silicon fabrication technology, architects are putting more and more logic into a single die. While one might opt to use these transistors for build...
Lin Li, Narayanan Vijaykrishnan, Mahmut T. Kandemi...
« Prev « First page 2073 / 2407 Last » Next »