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WSC
2007
15 years 6 months ago
An analysis of tool capabilities in the photolithography area of an ASIC fab
Photolithography is generally regarded as the most constraining element in semiconductor manufacturing. This is primarily attributable to the high capital investment and extensive...
P. J. Byrne, Cathal Heavey, Kamil Erkan Kabak
FI
2010
175views more  FI 2010»
15 years 1 months ago
Applications and Security of Next-Generation, User-Centric Wireless Systems
: Pervasive wireless systems have significantly improved end-users' quality of life. As manufacturing costs decrease, communications bandwidth increases, and contextual inform...
Jerry Rick Ramstetter, Yaling Yang, Danfeng Yao
COMPSAC
1997
IEEE
15 years 8 months ago
Model-integrated system development: models, architecture, and process
Many large software systems are tightly integrated with their physical environments and must be adapted when their environment changes. Typically, software development methodologi...
Gabor Karsai, Amit Misra, Janos Sztipanovits, &Aac...
ACSD
2004
IEEE
124views Hardware» more  ACSD 2004»
15 years 8 months ago
A Behavioral Type Inference System for Compositional System-on-Chip Design
The design productivity gap has been recognized by the semiconductor industry as one of the major threats to the continued growth of system-on-chips and embedded systems. Ad-hoc s...
Jean-Pierre Talpin, David Berner, Sandeep K. Shukl...
IJAIT
2000
142views more  IJAIT 2000»
15 years 4 months ago
Adequacy of Limited Testing for Knowledge Based Systems
Knowledge-based engineering and computational intelligence are expected to become core technologies in the design and manufacturing for the next generation of space exploration mi...
Tim Menzies, Bojan Cukic