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122
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ICFEM
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. In this paper we present a technique for the Spin tool, inspired by practical experiences with Spin and a FireWire protocol. We show how to guide simulations with Spin, b...
124
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ICCAD
2008
IEEE
15 years 11 months ago
2008
IEEE
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
144
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PATMOS
2007
Springer
15 years 10 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
144
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
132
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WSC
2008
15 years 6 months ago
2008
Demand forecast plays a critical role to determine capital investment for capacity planning. Given the involved uncertainties and long lead-time for capacity expansion, semiconduc...