1304 search results - page 103 / 261 » Simulation of Soliton Circuits |
ISMVL
2007
IEEE
15 years 4 months ago
2007
IEEE
Designing modern circuits comprised of millions of gates is a very challenging task. Therefore new directions are investigated for efficient modeling and verification of such syst...
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GLVLSI
2006
IEEE
15 years 4 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
ATS
1998
IEEE
15 years 2 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
In this paper we present a power dissipation model considering the charging/discharging of capacitance at the gate output node as well as internal nodes, and capacitance feedthrou...
GLVLSI
2009
IEEE
15 years 2 months ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...