A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
On-chip high-bandwidth sampling circuits supplement traditional test and debug techniques by non-invasively probing analog voltages for off-chip measurement. Existing circuits rel...
Frankie Liu, Ron Ho, Robert J. Drost, Scott Fairba...
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
— Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. This p...
I. Faik Baskaya, Brian Gestner, Christopher M. Twi...
An analog QRS complex detection circuit, for pacemaker applications, based on the Wavelet Transform (WT) is presented. The system detects the wavelet modulus maxima of the QRS com...
Sandro A. P. Haddad, Richard Houben, Wouter A. Ser...