The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review in...
Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, ...
We develop a new technique of proving lower bounds for the randomized communication complexity of boolean functions in the multiparty `Number on the Forehead' model. Our meth...
In performance-driven interconnect design, delay estimators are used to determine both the topology and the layout of good routing trees. We address the class of moment-matching, ...
The estimation of average-power dissipation of a circuit through exhaustive simulation is impractical due to the large number of primary inputs and their combinations. In this brie...
Ashok K. Murugavel, N. Ranganathan, Ramamurti Chan...
Small, embedded integrated circuits (ICs) such as smart cards are vulnerable to so-called side-channel attacks (SCAs). The attacker can gain information by monitoring the power co...