A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
This paper presents a transistor optimization methodology for low-power analog integrated CMOS circuits, relying on the physics-based gm/ID characteristics as a design optimizatio...
In this paper, we propose new models for directly evaluating DPA leakage from logic information in CMOS circuits. These models are based on the transition probability for each gate...
We present an equation-based transistor size optimizer that minimizes delay of custom circuits. Our method uses static timing analysis to find the critical paths and numerical met...
Xiao Yan Yu, Vojin G. Oklobdzija, William W. Walke...
SOI (silicon-on-insulator) technology suffers from a number of floating body effects, most notably parasitic bipolar and history effects. These are influenced by the rapidly incre...