Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. ...
A novel method which can be regarded as the noisecounterpart of the celebrated Elmore’s delay formula— both being based on the first two moments of the network’s transfer fu...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
- Two challenges for the accurate prediction of GHz CMOS analog/RF building blocks are presented. Challenging the usage of new compact MOSFET models enhances the simulation accurac...
— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...