Abstract—The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete sche...
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...
—Behavioral modeling with virtual built-in self-test verification of high-speed wired link designs is described in this paper. Our procedure is based on principles of top-down mi...
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...