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WCE
2007
14 years 11 months ago
Simulation of Transformer With Aging Insulation and Incipient Faults
Abstract—The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete sche...
X. Wang, Mark Sumner, D. W. P. Thomas
93
Voted
ENGL
2008
216views more  ENGL 2008»
14 years 10 months ago
Application of TLM and Cassie-Mayr Arc model on Transformer Aging and Incipient Faults Simulation
Abstract--The development of the transformer insulation failure undergoes three stages: insulation aging, incipient faults and a short circuit. This paper presents a complete schem...
X. Wang, Mark Sumner, D. W. P. Thomas
ISCAS
2006
IEEE
128views Hardware» more  ISCAS 2006»
15 years 4 months ago
Modeling and verification of high-speed wired links with Verilog-AMS
—Behavioral modeling with virtual built-in self-test verification of high-speed wired link designs is described in this paper. Our procedure is based on principles of top-down mi...
Ming-Ta Hsieh, Gerald E. Sobelman
ATS
2005
IEEE
56views Hardware» more  ATS 2005»
15 years 3 months ago
Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
Zaid Al-Ars, Said Hamdioui, Jörg E. Vollrath
ISQED
2005
IEEE
95views Hardware» more  ISQED 2005»
15 years 3 months ago
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein