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ICCAD
2008
IEEE
16 years 4 months ago
2008
IEEE
— With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM compone...
195
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ICCAD
2007
IEEE
16 years 4 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
157
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ICCAD
2003
IEEE
16 years 4 months ago
2003
IEEE
118
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ICCAD
2002
IEEE
16 years 4 months ago
2002
IEEE