1859 search results - page 89 / 372 » Sketch-based path design |
167
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DATE
2006
IEEE
16 years 6 days ago
2006
IEEE
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
165
Voted
ISSRE
2006
IEEE
16 years 4 days ago
2006
IEEE
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
178
Voted
ASPDAC
1995
ACM
15 years 9 months ago
1995
ACM
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
131
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TCAD
1998
15 years 5 months ago
1998
—This paper introduces a novel optimization paradigm for increasing the throughput of digital systems. The basic idea consists of transforming fixed-latency units into variable-...
152
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EWSN
2004
Springer
16 years 5 months ago
2004
Springer
Sensor networks consist of a potentially huge number of very small and resource limited self-organizing devices. This paper presents the design of a general distributed service dir...