86 search results - page 16 / 18 » Slipstream Processors: Improving both Performance and Fault ... |
145
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MOBICOM
1996
ACM
15 years 3 months ago
1996
ACM
This paper discusses extensions to the Rover toolkit for constructing reliable mobile-aware applications. The extensions improve upon the existing failure model, which only addres...
125
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DSN
2009
IEEE
15 years 6 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
ASAP
2008
IEEE
15 years 6 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
ISCA
2009
IEEE
15 years 6 months ago
2009
IEEE
Shared-memory multi-threaded programming is inherently more difficult than single-threaded programming. The main source of complexity is that, the threads of an application can in...
104
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VLSID
2001
IEEE
16 years 2 days ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...