This paper discusses extensions to the Rover toolkit for constructing reliable mobile-aware applications. The extensions improve upon the existing failure model, which only addres...
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Shared-memory multi-threaded programming is inherently more difficult than single-threaded programming. The main source of complexity is that, the threads of an application can in...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...